Scanning Microscopy for Nanotechnology

ISBN: 9780387333250

出版社: Springer Verlag

出版年: 2006-11

页数: 552

定价: $ 224.87

装帧: HRD

内容简介

This book presents scanning electron microscopy (SEM) fundamentals and applications for nanotechnology. It includes integrated fabrication techniques using the SEM, such as e-beam and FIB, and it covers in-situ nanomanipulation of materials. The book is written by international experts from the top nano-research groups that specialize in nanomaterials characterization. The book will appeal to nanomaterials researchers, and to SEM development specialists.