当前位置：在线查询网 > 图书大全 > Defects in High-k Gate Dielectric Stacks

Defects in High-k Gate Dielectric Stacks_图书大全


请输入要查询的图书：

可以输入图书全称，关键词或ISBN号

Defects in High-k Gate Dielectric Stacks

ISBN: 9781402043666

出版社: Springer Verlag

页数: 492

定价: 99

装帧: Pap

关键词：Defects in High k Gate Dielectric Stacks