Advances in Scanning Probe Microscopy

ISBN: 9783540667186

出版社: Le Lezard Noir

出版年: 2008

页数: 341

定价: $ 154.81

内容简介

This book covers several of the most important topics of current interest at the forefront of scanning probe microscopy. These include a realistic theory of atom-resolving atomic force microscopy (AFM), fundamentals of MBE growth of III-V compound semiconductors and atomic manipulation for future single-electron devices.